EEGR 633 - Automated Measurements, Devices & Systems

3 hours.
3 Credits

Students will be introduced to the fundamentals of high-frequency measurements and techniques for accuracy-enhanced microwave measurements. Automated network analyzers and high-speed wafer probes are used in conjunction with state-of-the-art calibration techniques. Non-linear modeling of active devices will be introduced.

Offered (FALL OR SPRING)