May 09, 2025  
2022-2024 Graduate Catalog 
    
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2022-2024 Graduate Catalog [ARCHIVED CATALOG]

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EEGR 643 - Advanced Semiconductor Characterization

3 hours.
3 Credits

This course is an advanced approach to the measurement of physical principles underlying semiconductor device operation. Topics include measurement techniques of physical parameters in semiconductor material and device structures: impurity profiling, carrier transport, and deep and shallow level trap characterization.

Offered (FALL OR SPRING)


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