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May 11, 2025
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EEGR 633 - Automated Measurements, Devices & Systems
Three hours.
3 Credits
Students will be introduced to the fundamentals of high-frequency measurements and techniques for accuracy-enhanced microwave measurements. Automated network analyzers and high-speed wafer probes are used in conjunction with state-of-the-art calibration techniques. Non-linear modeling of active devices will be introduced.
Prerequisite(s) None
Co-Requisite(s) None
Offered FALL OR SPRING
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