May 11, 2025  
2018-2020 Graduate School Catalog 
    
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2018-2020 Graduate School Catalog [ARCHIVED CATALOG]

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EEGR 643 - Advanced Semiconductor Characterization

Three hours.
3 Credits

This course is an advanced approach to the measurement of physical principles underlying semiconductor device operation. Topics include measurement techniques of physical parameters in semiconductor material and device structures: impurity profiling, carrier transport, and deep and shallow level trap characterization.

Prerequisite(s) None
Co-Requisite(s) None
Offered FALL OR SPRING


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